A to Z of electrochemical impedance spectroscopy (EIS) interpretation

A to Z of electrochemical impedance spectroscopy (EIS) interpretation

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Electrochemical Impedance Spectroscopy (EIS) is a powerful tool enabling the study of processes that occur at the interface of an electrode.

In EIS a periodic signal is applied in current or voltage at several frequencies. The periodic signal is traditionally built with a sinus.
The transfer function H of the system is defined as:

H(s)=L[Output(t)]L[Input(t)]H(s)=ℒ[Output(t)]ℒ[Input(t)] (1)

ℒ  being the Laplace transform

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Analysis and interpretation of EIS spectra

Analysis and interpretation of EIS spectra

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Corrosion of steels represents worldwide, one of the most costly problems that several industries are challenged every day due to the aggressive conditions during the manufacturing process of the steel parts or the premature failure of steel tools by stress corrosion cracking (SCC) as well as deterioration of steel components from equipment and machinery in a certain service. The construction industry is an example in where steel is essential, which requires durable and strong structures for the build of bridges, tunnels, towers, buildings, airports, roads, plants and railways. Many of these constructions are usually outdoors, exposed to the atmosphere conditions, additionally, the surrounding environment where these steels are placed for their service is often highly polluted, that it often degrades the steel structure at a considerable corrosion rate.

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Fundamentals of Fourier Transform Infrared spectroscopy

Fundamentals of Fourier Transform Infrared spectroscopy

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Infrared (IR) spectroscopy is a chemical analytical technique, which measures the infrared intensity versus wavelength (wavenumber) of light. Based upon the wavenumber, infrared light can be categorized as far infrared (4 ~ 400cm‐1), mid infrared (400 ~ 4,000cm‐1) and near infrared (4,000 ~ 14,000cm‐1).

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Free software for FTIR analysis

Free software for FTIR analysis

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Fourier Transform Infrared Spectroscopy (FTIR) is one of the most widely used analytical techniques in materials science, chemistry, pharmaceuticals, polymers, nanotechnology, and environmental studies. While collecting an FTIR spectrum is straightforward, extracting reliable structural and chemical insights requires proper software.

In this guide, we introduce the most useful free, trial, and professional FTIR data-analysis tools available today—along with a note about Analyzetest.com, a professional service for accurate spectrum interpretation.

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Steps of FTIR interpretation

Steps of FTIR interpretation

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1. Determine the X-axis and the Y-axis of the spectrum. The X-axis of an IR spectrum is labeled as “Wavenumber” and ranges in number from 400 on the far right to 4,000 on the far left. The X-axis provides the absorption number. The Y-axis is labeled as “Percent Transmittance” and ranges in number from 0 on the bottom and 100 at the top.

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How to analyze UV-Vis spectra?

How to analyze UV-Vis spectra?

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An obvious difference between certain compounds is their color. Thus, quinone is yellow; chlorophyll is green; the 2,4-dinitrophenylhydrazone derivatives of aldehydes and ketones range in color from bright yellow to deep red, depending on double bond conjugation; and aspirin is colorless. In this respect the human eye is functioning as a spectrometer analyzing the light reflected from the surface of a solid or passing through a liquid.

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How to analyze “XRD” patterns?

How to analyze “XRD” patterns?

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X-ray diffraction (XRD) is a technique used in materials science for determining the atomic and molecular structure of a material. This is done by irradiating a sample of the material with incident X-rays and then measuring the intensities and scattering angles of the X-rays that are scattered by the material. The intensity of the scattered X-rays are plotted as a function of the scattering angle, and the structure of the material is determined from the analysis of the location, in angle, and the intensities of scattered intensity peaks. Beyond being able to measure the average positions of the atoms in the crystal, information on how the actual structure deviates from the ideal one, resulting for example from internal stress or from defects, can be determined.

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How to analyze “XPS” spectra?

How to analyze “XPS” spectra?

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X-Ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA) is a non-destructive technique used to analyze the surface of a material. The XPS will measure the elemental composition, chemical state as well as the electronic state, thickness measurements of overlayers (up to 8nm), and will give you the empirical formula of the material that is being analyzed. This instrument will only detect elements with an atomic number higher of 3 and higher since hydrogen and helium atoms are very small and the probability of detecting them is almost zero. Also, it can only analyze depths ranging from 1 to 10nm, for this reason it only gives analysis of the surface. Preparation of the samples is minimal if any; you can analyze samples “as receive” or can clean the surface to eliminate any contaminates that might be present. Some examples that can be analyzed using the XPS are elements, metal alloys, semiconductors polymers, ceramics, and inorganic compounds. Other examples include paints, inks, viscous oils, wood and papers.

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