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The Scanning Electron Microscope (SEM) produces images by probing the specimen with a focused electron beam that is scanned across a rectangular area of the specimen (raster scanning).
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A to Z of Atomic force microscopy (AFM)
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Atomic force microscopy (AFM) is a technique with multiple applications in biology. This method is a member of the broad family of scanning probe microscopy and was initially developed in 1986 by Binnig et al to o...
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Analysis and interpretation of Energy-Dispersive X-Ray Spectroscopy (EDS) results
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Interaction of an electron beam with a sample target produces a variety of emissions, including x-rays. An energy-dispersive (EDS) detector is used to separate the characteristic...
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Analysis and interpretation of atomic force microscopy (AFM) results
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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times...
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The principle of Transmission Electron Microscope (TEM)
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To satisfy this curiosity, many inventions have been devised. One of them is the optical microscope. The human eye can distinguish objects down to about 0.2 mm. Optical microscopes reveal small objects, which would be other...
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A to Z of scanning electron microscopy (SEM)
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The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions re...
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